利用FPGA实现红外焦平面器件的非均匀性校正

IRFPA nonuniformity correction using the FPGA technology

与红外单元器件系统相比 ,焦平面面阵探测器的一个最大的缺点是其固有的非均匀性 ,尽管现在面阵探测器的非均匀性有了很大改进 ,但是非均匀性仍然限制凝视红外系统的探测性能。实用化、实时的非均匀性校正是红外焦平面器件应用的一个关键技术 ,尽管现在已经有很多种基于场景的非均匀性校正方法 ,但是两点校正算法仍然是基础的校正方法 ,有不可替代的价值。两点校正算法的流程简单固定 ,非常适合用FPGA实现。文章介绍了利用FPGA硬件实现焦平面探测器非均匀性的两点校正算法 ,实验达到了预期效果 ,同时也显示了该算法的一些不足之处。

Compared to one element detector infrared system, the most difficult problem associated with the IR focal plane array is spatial photoresponse nonuniformity. Although the detector's performances, including uniformity, have been improved greatly, the staring IR system performance is crucial limited by the nonuniformity. Applicable and real time nonuniformity correction is a key technology in the application of IRFPA. There are many scene\|based nonuniformity correction methods, in which the two\|points correction method as a basic method is used widely. The two\|points correction algorithmic flow is simple and fixed, and suitable to be implemented by FPGA. In this paper, the two\|points method of nonuniformity correction using the FPGA technology is presented. The experiment results are given. \;