微波真空电子器件磁控管的失效率模型

Failure Rate Model of Microwave Vacuum Electronic Devices

以磁控管现场使用数据和失效模式为基础，根据真空电子器件失效率或平均寿命等可靠性指标的考核方法，对新版（ＧＪＢ２９９Ｂ）电子设备可靠性预计手册中的失效率模型与旧版（ＧＪＢ２９９Ａ）进行了验证对比。结果表明，新版比旧版更接近实际，而且其预计精度也有明显提高，新版所建立的失效率数学模型可以满足工程的实际要求。

Based upon the field usage data and failure models,quantitative reliability level of reliability level of magnetrons in China was offered.Efforts have been made by employing reliability theory to determine the reliability failure rate of vacuum electronic devices in terms of failure rate and average lifetime,By comparing the failure models in the new edition of electronic equipment reliability prediction handbook(GJB299B) with the old edition(GJB 299 A), it has been proved that the prediction failure models of the new edition are more close to actualty than those of old edition,and the precision is obviously increased.This new established mathematical models is practical and it can satisfy the requirements of most engineering application.