摘要
利用快速筛选技术对低频大功率三极管快筛是一种经济、有效的筛选手段，它可以有效地剔除热敏参数不良的器件，保证整批器件的可靠性。
Rapid screening test technique applied to low-frequency and high-power transistor is a cost-effective method, which can effectively remove devices with poor thermosensing and ensure the lot reliability
出处
《电子产品可靠性与环境试验》
2000年第4期21-24,共4页
Electronic Product Reliability and Environmental Testing
关键词
低频
大功率三极管
快速筛选
rapid screening
thermosensing parameter
failure criteria
