摘要
The compound Ba0.615Sr0.35Mg0.035TiO3 was analyzed by the X-ray dispersed spectroscopy analyzer (SEM-EDAX) with the spec-trum image method, a powerful tool for chemical phase identification. The method was first time applied on a ceramic material to collect spectrum image and was progressed to identify the Mg-enriched component with fine scale pocket shown in matrix. This result, together with the stoichiometry result obtained from spot mode spectrum analysis, strongly confirmed the microstructure and properties of dielectric materials.
The compound Ba0.615Sr0.35Mg0.035TiO3 was analyzed by the X-ray dispersed spectroscopy analyzer （SEM-EDAX） with the spectrum image method, a powerful tool for chemical phase identification. The method was first time applied on a ceramic material to collect spectrum image and was progressed to identify the Mg-enriched component with fine scale pocket shown in matrix. This result, together with the stoichiometry result obtained from spot mode spectrum analysis, strongly confirmed the microstructure and properties of dielectric materials.
