摘要
利用正交设计法设计了实验方案,可通过较少的实验获得满意的实验结果。在"强光一号"上对BiMOS工艺运算放大器CA3140进行了瞬时电离辐射效应实验,研究了不同因素对CA3140输出端瞬时电离辐射扰动恢复时间的影响,得到不同因素对恢复时间产生影响的主次顺序和显著水平,以及运算放大器在瞬时电离辐射环境下的最劣偏置条件。
Using the orthogonal design method to arrange tests,a satisfactory result can be acquired with less experiments.The transient ionizing radiation effects experiments on BiMOS op-amp CA3140 were done on ＂Qiangguang-1＂ accelerator in this work to study the impact of different factors on the recovery time of CA3140 by transient ionizing irradiation.The sub-sequence and the significant level of the factors for the recovery time,as well as the worst bias conditions for CA3140 under transient ionizing irradiation were obtained.
出处
《原子能科学技术》
EI
CAS
CSCD
北大核心
2012年第B09期592-597,共6页
Atomic Energy Science and Technology
