基于辐射回避的SRAM型FPGA瞬时电离辐射效应测试系统研制

Development of Test System for Transient Ionizing Radiation Effects on SRAM-Based FPGA Based on Radiation Evade Mechanism

介绍了瞬时电离辐射环境中SRAM型FPGA配置存储器测试的实现方法,提出了将辐射回避应用于FPGA瞬时电离辐射效应测试的方法,设计了可辐射回避的在线测试系统,并对FPGA进行了瞬时电离辐射效应实验。结果表明,测试系统能准确、可靠地进行配置存储器测试,辐射回避是实现大规模集成电路瞬时电离辐射效应测试的有效手段。

A method was introduced to realize the configuration memory test on SRAM-based FPGA in the transient ionizing radiation environment.Applying radiation evade mechanism to the test of transient ionizing radiation effects on SRAM-based FPGA,an online test system in which peripheral test circuits evaded the pulse interferes was designed.Based on the established test system,experiments were performed on FPGA using ＂Qiangguang-I＂ accelerator.Results show that the test system can test the configuration memory accurately and reliably,and radiation evading is an efficient mean to realize the test on large scale integrated circuits in transient ionizing radiation effects.