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ALT在电子产品中的应用分析

Discussion on Applicaion of Accelerated Life Test in Electronic Products
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摘要 加速寿命试验是预测产品可靠性的重要方法,在实践中得以广泛应用。本文简要分析加速寿命试验的原理,并探讨它在电子产品中的应用。 Accelerated life test is the important method to predict the reliability which is widely used in practice. This paper analyses the principle of accelerated 1 discusses its application in electronic product of products, ife test, and
作者 李军 王玉梅
出处 《环境技术》 2012年第5期19-21,共3页 Environmental Technology
关键词 电子产品 可靠性 加速寿命试验 electronic products reliability accelerated life test
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  • 1陈文华,钱萍,方晶敏,周升俊,卢献彪.综合应力加速寿命试验方案模拟评价的理论与方法[J].宇航学报,2007,28(6):1768-1773. 被引量:10
  • 2李晓阳,姜同敏.加速寿命试验中多应力加速模型综述[J].系统工程与电子技术,2007,29(5):828-831. 被引量:63
  • 3Xiong C,Zhu K,Ji M.Analysis of a simple step-stress life test with a random stress-change time[J].IEEE Trans.on Reliability,2006,55(4):67-74.
  • 4Wu S J,Lin Y P,Chen Y J.Planning step-stress life test with progressively type I group-censored exponential data[J].Statistic Neerlandica,2006,60(2):46-56.
  • 5Abd-Elfattah A M.Estimation in step-stress partially accelerated life tests for the Burr type XII distribution using type I censoring[J].Statistical Methodology,2008,5(6):502-514.
  • 6Li C,Fard N.Optimum bivariate step-stress accelerated life test for censored data[J].IEEE Trans.on Reliability,2007,56(4):77-84.
  • 7Fard N,Li C.Optimum simple step stress accelerated life test design for reliability prediction[J].Journal of Statistical Planning and Inference,2009,139(5):1799-1808.
  • 8Balakrishnan N,Xie Q.Exact inference for a simple step-stress model with type I hybrid censored data from the exponential distribution[J].Journal of Statistical Planning and Inference,2007,137(4):3268-3290.
  • 9Balakrishnan N,Xie Q.Exact inference for a simple step-stress model with type II hybrid censored data from the exponential distribution[J].Journal of Statistical Planning and Inference,2007,137(3):2543-2563.
  • 10Balakrishnan N,Kundu D,Ng H K T,et al.Point and interval estimation for a simple step-stress model with type II censoring[J].Journal of Quality Technology,2007,39(1):35-47.

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