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基于Test Director6和边界扫描的板级测试技术

Technique of Board Level Test Based on TestDirector6 and Boundary Scan Technique
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摘要 在国内首次介绍了Qmax公司的Test Director6开发工具在JTAG测试中的应用,并首次提出了利用Test Director6进行基于JTAG技术的板级测试方法。实验证明,该方法成熟高效,能有效提高测试效率和测试可靠性,具有较大的实用价值。 It introduced the application of JTAG test with Test Director6 at the first time in China, and proposed a new method of board level JTAG test based on Test Director6. The experiment shows that this method is effec- tive, and this method can improved the efficiency and reliability of the test.
作者 王欣 李银辉
出处 《核电子学与探测技术》 CAS CSCD 北大核心 2012年第8期968-970,共3页 Nuclear Electronics & Detection Technology
关键词 边界扫描 TEST Director6 板级测试 JTAG Boundarg scan JTAG Test Director6 BST
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