基于V-系统的商标检索

A NOVEL ALGORITHM FOR TRADEMARK RETRIEVAL BASED ON V-SYSTEM

商标图像检索是实现商标查重的重要手段之一,其目的是对商标图像之间的重复性、相似性进行审查.基于一类称为V系统的正交函数系,提出一种商标检索的新算法.通过V系统对商标轮廓图形进行精确的正交表达,在频域求得商标的特征向量,利用特征向量间的欧氏距离来进行商标之间的相似度量,从而得到一类新的商标检索算法.通过与Fourier描述子、Zernike矩方法的实验比较,得出V系统在商标检索中的明显优势.

Trademark image retrieval is one of important means for trademark distinctness check; the purpose is to review the repeatability and similarity among trademark images. This paper proposes a new trademark retrieval method based on an orthogonM function system called V-system. The contour of a trademark is accurately expressed with finite basis orthogonal functions of V-system, and then its eigenvectors are extracted. The Euclidean distance between eigenvectors is used to calculate similarity of two trademarks, and then trademark retrieval can be carried out. We compare our method with Fourier descriptor and Zernike moments, and finally, the experiment results indicate that V-system has great advantage on trademark retrieval.