发散X射线晶体衍射模拟研究

SIMULATION STUDY OF DIVERGENT BEAM X-RAY DIFFRACTION BY CRYSTALS

根据晶体的对称性、衍射几何和衍射规律,研究了复杂的发散X射线晶体衍射。描述了模拟这种衍射的方法。由计算机产生的背射赝Kossel线花样与实验结果完全相符,并能识别出衍射图中所有线条的衍射指数。完成了一套由计算机绘制的〈100〉,〈110〉和〈111〉取向的Si单晶的发散衍射标准图谱。

Acoording to the crystal symmetry, diffraction geometry and the diffraction laws, the complicated divergent beam X-ray diffraction has been studied. A method for simulating such diffraction is described. The computer generated pseudo-Kossel line patterns are exactly consistent with those recorded in experiment and the indices of all diffraction lines in the patterns can be identified. A set of standard divergent diffraction diagrams related to 〈100〉, 〈110〉 and 〈111〉oriented Si single crystals are completed successfully by computer.