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用氢等离子清洗改善BGA的可焊性

Improving Solderability of BGA with Hydrogen Plasma
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摘要 BGA器件的焊球往往都非常容易氧化,焊接后的BGA焊点不仅外观上不过关,其电性能和热性能也大打折扣。但是BGA焊球的去氧化问题一直没有很好的解决方法。介绍一种氢等离子体再流焊去氧化物的方法,该方法把氢等离子体和适度加热有机地结合在一起,能有效地去除BGA焊球表面的氧化物。该方法工艺简单,效果显著,效率也很高,是清除BGA元器件和其他表面贴装元器件氧化物的最佳方法。 The solder balls of BGA are very easily oxidized.The appearance of BGA solder joints after reflow solder are unqualified,their electronic properties and thermal properties are very bad too.The deoxidation problem of BGA solder balls has not been solved.Introduce a good deoxidation method with hydrogen plasma reflow solder.This method organically combines hydrogen plasma and heating properly,it can effectively remove oxide layer of BGA solder balls.This method and process are simple,the result is noticeable,and the efficiency is high too.It is the best method to remove oxide layer of BGA and other surface mounting devices.
作者 林伟成
出处 《电子工艺技术》 2012年第6期351-354,376,共5页 Electronics Process Technology
关键词 BGA 焊球 氧化物 氢等离子体 BGA solder balls oxide layer Hydrogen plasma
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  • 1王文利,梁永生.BGA空洞形成的机理及对焊点可靠性的影响[J].电子工艺技术,2007,28(3):157-159. 被引量:28
  • 2徐匡迪 蒋国昌 徐建伦 等.21世纪钢铁生产流程的理论解析[A]..北京第125次香山科学会议文集[C].北京:香山科学会议中心,1999.31-44.
  • 3Peng C T, Liu C M, Lin J C et al. Reliability analysis and design for the fine - pitch flip chip BGA packaging [ J ]. IEEE transactions on components and packaging technologies,2004, 27 (4) :684 - 693.
  • 4Sparks D, Massoud - Ansari S, Najafi N. Chip - level vacuum packaging of micromaehines using nanogetters [ J ]. IEEE transactions on advanced packaging, 2003,26 {3) :277-282.
  • 5Cheng Y T, Hsu W T, Khalil N et al. Vacuum pack - aging technology using localized aluminum/silicon - to - glass bonding[ J]. Journal of microelectromechanical systems,2002,11 (5) :556 -565.
  • 6Hong S M,Kang C S,Jung J P. Flux -free direct chip attachment of solder - bump flip chip by Ar + H(2)plasma treatment [ J ]. Journal of electronic materials,2002,31 (10):1104-1111.
  • 7Yunus M, Primavera A, SrihariK et al. Effect of voids on the reliability of BGA/CSP solder joints [ J ]. Microelectronics reliability ,2003,43 ( 12 ) :2077 - 2086.
  • 8[1]Doeter Bergman.Roadmap to BGA standads[J].SMT,2000,10.
  • 9[2]Fred Schlieper.Integration of X-ray inspection and rework improves SMT yields[J].SMT.2001,5.
  • 10IPC美国电子工业联接协会.IPCLJEDEC J-STD-033潮湿,回流敏感性SMD的处理、包装、装运和使用标准[S].1999.

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