摘要
采用足底电击结合噪音制做大鼠应激模型 ,以免疫组织化学 ABC法研究了大鼠脑内 c- fos癌基因蛋白 ( FOS)在慢性应激过程中的表达情况。结果显示 ,正常对照组大鼠脑内无 FOS阳性细胞出现。而应激组大鼠脑内 FOS的表达部位随应激时间的延长而呈下降趋势 ,说明随应激时间的延长大鼠脑内不同核团神经元功能发生不同程度的障碍。大鼠的痛阈在应激后 3,9d无明显变化而在第 1 5天大鼠痛阈明显升高 ,说明长时间的电刺激产生了镇痛。
The experiments were performed on animal model of stress with repetitive eletric foot shock.The expressions of FOS in brain of rats were tested with ABC method of immunohistochemistry.The result is that there were no FOS immunoreactive positive neurons in the brain of normal rats in stressed rats,and the distributions of the FOS expression in brain became fewer and fewer during the continuing stress induced defensive reaction in stressed rats .It means that stress may induce functional disorder of neurons in the different nucleus of brain of rat.The pain threshold changed very little within 9 days of stress ,but after stress for 15 days, the pain threshold increased significantly (P<0 01).It is suggested that the long term electric shock may induce the analgesia. [
基金
国家自然科学基金!( 3 9670 2 75 )
