摘要
X射线光电子能谱 (XPS)是一种有效的表面化学测试手段 ,对化合物中各种元素的化学状态具有非常敏感的探测能力 ,从而对复杂材料的成键机理提供有效的信息 .通过研究TiP AMP中各元素在复合前后的X结合能谱的化学位移 ,对交换材料的复合机理进行了探讨 .
As a sensitive superficial inspection method, X ray photoelectronic spectroscopy(XPS) is very useful for chemical structure detection, It can offer very useful information for the bonding mechanism of complex material. The XPS of each elements in the complex inorganic ion exchanger titanium phosphate ammonium molybdophosphate(TiP-AMP) was studied. The complex mechanism of the substance was discovered through studying binding energy shift of each elements.
出处
《分析测试技术与仪器》
CAS
2000年第2期119-121,共3页
Analysis and Testing Technology and Instruments