基于椭偏光谱仪的石英波片光轴方位探测

Determination of Optical Axis of Quartz wave Plate Based on Spectroscopic Ellipsometer

波片的光轴方向是波片应用中最重要的参数之一。在椭偏光谱仪透射模式下,利用琼斯矩阵对波片旋转过程中P和S两方向上位相的变化进行分析,设计了一种判断石英波片光轴方向的新方法。应用此方法判断光轴方向,具有光路结构简单,检测速度快的特点,且具有很好的实用性。

The optical axis is one of the most important parameters in the application of wave plates.In the transmission mode of spectroscopic ellipsometer,taking the advantage of Jones matrix to analyse the phase difference of P and S directions in the process of spinning wave plate,a new method for the determination of optical axis of quartz wave plate was designed.The method has characteristics of simple light path structure and high efficiency in the judging of the optical axis,and this method thus got a good practicability.