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Structural and Optical Investigations of Ge20Se80-xBix Thin Films

Structural and Optical Investigations of Ge20Se80-xBix Thin Films
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出处 《材料科学与工程(中英文B版)》 2012年第10期560-568,共9页 Journal of Materials Science and Engineering B
关键词 多晶结构 光学调查 薄膜 X-射线衍射 化学计量比 复合合金 沉积速率 热蒸发法 Ge20Se80-xBix thin films, GeSe thin films, thermal evaporation technique
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参考文献22

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