摘要
在热循环试验中,由于温度变化大,导致试验产品表面出现结露现象,对部分电子产品造成损坏。通过分析结露产生的原因,提出两种方法降低试验箱内的水蒸汽,防止试验过程中结露的产生。
The large variation of temperature in the thermal cycle test leads to the condensation of water vapor in the surface of test products. This may cause damage on some of electronic products. By analyzing the formation of dew, the paper pro- posed two methods to reduce the water vapor in the test chamber and prevent the generation of dew condensation in the testing process.
出处
《真空与低温》
2012年第4期241-243,共3页
Vacuum and Cryogenics
关键词
热循环试验
结露的产生
结露的预防
thermal cycle test
the formation of dew
the prevention of dew
