期刊文献+

电感耦合等离子体发射光谱法测定稀土精矿中二氧化硅的含量 被引量:8

Determination of Silicon Oxide Content in Rare Earth Concentrate by Inductively Coupled Plasma Atomic Emission Spectrometry
原文传递
导出
摘要 稀土精矿经碱熔融后在盐酸介质中根据硅元素的发射光谱特征谱线进行测定,试验系统考察了各类型稀土精矿稀土品位高时共存元素对硅元素的谱线干扰情况以及所能达到的方法下限,配制高含量的试样来确定方法的上限。通过和原国家标准方法 -重量法和硅钼蓝光度法的对照,进一步确定了方法的准确度。由于方法快捷,准确,已被确立为国家标准分析方法。二氧化硅测定范围:0.50%~10.00%。 Determination of silicon content in rare earth concentrate was conducted by using characteristic spectrum of sili- con in hydrochloric acid, Effects of interference of co - existing elements in different types of RE concentrates on the silicon' s spectrum were investigated. The detection limits were also determined in experiments. Comparing to gravimetric method, the original national standard method and silicon molybdenum blues photometry, this method is more rapid and more accurate and has been established as the national standard method. Detection scope of silicon oxide is 0.50% - 10.00%.
出处 《稀土》 EI CAS CSCD 北大核心 2012年第6期57-60,共4页 Chinese Rare Earths
关键词 发射光谱法 稀土精矿 二氧化硅 atomic emission spectrometry rare earth concentrate silicon oxide
  • 相关文献

参考文献10

二级参考文献31

共引文献44

同被引文献316

引证文献8

二级引证文献38

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部