大规模集成电路抗辐射性能无损筛选方法

Non-destructive screening method for radiation hardened performance of large scale integration

空间辐射环境会对电子器件产生辐射损伤。由于商用器件性能普遍优于抗辐射加固器件,所以从商用器件中筛选出抗辐射性能优异的器件将在一定程度上提高空间电子系统的可靠性。结合数学回归分析与物理应力实验的方法,研究了集成电路抗辐射性能无损筛选技术。通过不同的外界能量注入及总剂量辐照实验,探究电路典型参数的应变情况与电路耐辐射性能的关系,并确定其辐射敏感参数;建立预测电路抗辐射性能的多元线性回归方程,并对应力条件下的回归方程进行辐照实验验证。结果显示,物理应力实验与数学回归分析结合的筛选方法减小了实验值与预测值的偏差,提高了预估方程的拟合优度和显著程度,使预估方程处于置信区间。

The space radiation environment could induce radiation damage on the electronic devices. As the performance of commercial devices is generally superior to that of radiation hardened devices, it is necessary to screen out the devices with good radiation hardened performance from the commercial devices and applying these devices to space systems could improve the relia- bility of the systems. Combining the mathematical regression analysis with the different physical stressing experiments, we inves tigated the non-destructive screening method for radiation hardened performance of the integrated circuit. The relationship be- tween the change of typical parameters and the radiation performance of the circuit was discussed. The irradiation-sensitive pa- rameters were confirmed. The pluralistic linear regression equation toward the prediction of the radiation performance was estab- lished. Finally, the regression equations under stress conditions were verified by practical irradiation. The results show that the reliability and accuracy of the non-destructive screening method can be elevated by combining the mathematical regression analysis with the practical stressing experiment.