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用于60GHz CMOS芯片测试的片上巴伦的设计

Design of on-chip balun used for 60GHz CMOS chip measurement
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摘要 介绍了一种60GHz频段的测试用片上巴伦,采用调节中间抽头位置的方法来补偿巴伦的不平衡。仿真结果表明其幅度不平衡度为0.01dB,相位不平衡度为2°,损耗为1.1dB。并讨论了如何用二端口矢量网络分析仪来测试巴伦的小信号参数以及如何用巴伦来测试差分电路的差分S参数。 This paper introduces a on-chip balun used for 60GHz frequency band test, method of tuning the position of center-tap is proposed to compensate for the imbalance of the balun. The simulation results show the amplitude imbalance is 0.01dB, phase imbalance is 2°, insertion loss is 1. ldB. How to measure the small signal S parameter of the balun using two port vector network analyzer and how to measure the differential S parameter of the differential circuit using the balun are also discussed.
作者 郭开喆 黄鹏
出处 《信息技术》 2013年第1期112-114,共3页 Information Technology
关键词 60GHz 片上巴伦 测试 CMOS 60GHz on-chip balun text CHIOS
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参考文献2

  • 1Aoki I, Kee S D, Rutledge D B,et al. Distributed active transformer a new power-combining and technique [ J]. IEEE Trans. Microwave Theory & Tech. , Jan. 2002,50( 1 ) : 316 -331.
  • 2Zhao Y, Long J R, Spirito M. Compact transformer power combiners for millimeter-wave wireless applications[ C]//Proc. of IEEE RF- IC, 2010:223 - 226.

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