集成电路长期可靠性的研究

Study on Long-time Reliability of IC’s

文章针对集成电路产品的封装长期可靠性,提出了新的方法和标准;对集成电路产品的长期可靠性的考评,按照国际标准的要求进行了分析。对集成电路产品的实际长期老化筛选方面进行了研究和总结,并且针对实际产品进行了案例分析。该标准和方法可以确保集成电路产品在特殊应用条件下长期使用的稳定性,有一定的应用价值。

This paper study assembly long time reliability and get a new method and standard. For IC long time reliability, this paper study with international criterion. And long time BI sort of IC also are researched. This paper analyzes the practical product by the above investigation. These methods qualify the reliability of IC long time for special application, and have high application value.