面向综合诊断的电子装备测试资源优化分配

Integrated Diagnostics Oriented Optimized Allocation of Electronic Equipment's Test Resource

针对综合诊断思想对电子装备测试资源分配的新要求,在测试点优化的基础上,建立了装备BITE与ATE优化分配的模型。该模型以测试代价最小为优化目标,以故障检测率、故障隔离率及虚警率为约束条件并通过LINGO求解。结果表明,该方法在满足测试性指标的同时降低了测试代价,对装备分层次设计和诊断、提高保障效率、减少寿命周期费用,具有重要意义。

Considering the requirements of integrated diagnostics to electronic equipment for test resource allocation, we established the optimized allocation models of Built-In Test Equipment （BITE） and Automatic Test Equipment （ATE） based on test points＇ optimization. Taking the minimum test cost as the optimization object, and with the constraint conditions of fault detection rate, fault isolation rate and false alarm rate, this model was solved by LINGO. The results indicated that this method can meet the testability indicators while reducing the test cost, which is of great significance to hierarchy design and diagnostics of equipment for increasing logistic support efficiency as well as decreasing life-cycle cost.