摘要
介绍了采用单变迁故障模型的时序系统状态组区别序列测试方法 ,通过选择状态组区别序列优化测试序列长度。这种测试生成方法比时序电路门级测试生成快得多 ,而且能达到很高的故障覆盖率。
A method for test generation of state group differen tiating sequence for sequential systems based o n a single transition fault model is des cribed The length of test sequence is o ptimized by selecting state group differ entiating sequence set In comparison wi th a gate level test generation STG,a ve ry high fault coverage is obtained for s everal machines and test generation time is shortened.
出处
《微电子学》
CAS
CSCD
北大核心
2000年第3期188-192,共5页
Microelectronics
关键词
时序电路
状态组区别序列
测试
Sequentia l system
Test generation
State group dif ferentiating sequence
