摘要
本文给出一种测量分层媒质复介电常数的方法 ,经过多次测量复反射系数并建立恰当的目标函数 ,采用遗传算法求解这一优化问题可得到分层媒质的参数。测量结果表明 ,对于层数较少的媒质 ,在各分层厚度未知的情况下仍可测得各分层的复介电常数 。
A method for measuring the complex dielectric p ermittivity of layered mediums is presented.By measuring complex reflection coef ficient several times and constructing the objective function properly,the compl ex dielectric permittivity of layered medium can be evaluated using Genetic Algo rithm.The experimental results show that the complex permittivity and the length s of the mediums can be evaluated simultaneously in the case of less layers.
出处
《微波学报》
CSCD
北大核心
2000年第2期122-125,共4页
Journal of Microwaves
关键词
分层媒质
复介电常数
微波测量
参数测量
Layered medium,Complex dielectric permittivity ,Microwave measurement, Genetic Algorithm
