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基于Compton散射的缺陷检测研究 被引量:1

The Research on Defect Inspection Based on Compton Scattering
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摘要 从工程应用的角度出发介绍了一种较新的无损检测方法 ,即利用 Compton散射进行工件内部的缺陷检测。指出了利用 Compton散射进行缺陷检测的意义 ,分析了其检测原理和数学模型 ,采用真空电离室对其进行了初步实验 ,对实验结果进行了分析 ,并指出了进一步的研究重点和应用前景。实际表明 ,Compton散射法检测具有结构灵活、灵敏度高等优点 ,在一些特殊场合具有独到的优势 ,积极开展这方面的应用研究具有明显的研究意义。 A new non-destructive testing techn iq ue is investigated from the point of view of engineering application,that is the defect inspection in workpiece by Compton scattering.The significance of Compto n scattering for defect inspection is pointed out.The inspecting principle and t he mathematical model are analyzed.Meanwhile,the vacuum ionization chamber is em ployed for the primary experiment of Compton scattering inspection with the expe riment results analyzed.Moreover,the research emphasis and the applying outlook are pointed out.It is indicated through practice that the Compton scattering tec hnique processes the advantage of flexible structure and high sensitivity,which is unique predominance in some special cases.It goes without saying that it is v ery significant to carry out further research for application.
出处 《光电子.激光》 EI CAS CSCD 2000年第3期303-305,共3页 Journal of Optoelectronics·Laser
关键词 射线检验 缺陷检测 COMPTON散射 无损探测 radiological inspection defect inspe ction Compton scattering X-ray energy detection
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  • 1Zhu P,NDTE Int,1995年,28卷,1期,3页
  • 2蒋 明,原子核物理导论,1983年

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