摘要
传统的微粒测量方法由于硬件技术限制通道数一般设置为 4~ 16个 ,且采用模拟电路分通道 ,故而精度较低 ,速度慢 ,同时其判读方法对散射谱的扰动、噪声、奇变不能识别 ,所以产生了一定的测量误差。对此 ,本文提出了以 A/ D转换值为地址和 A/ D转换总数为通道数。最大可扩充到无限多个通道 ,按不同地址 ,对应不同的散射响应峰值 V,以门值作为记录开关 ,记录该通道的粒子数。这种方法解决了传统判读错误的问题 ,同时大大扩展了通道数 ,提高了仪器的测量精度和速度。
In generally,only 4~16 channels me asuring method is used by limited by hardware condition and analogue.Used in it, so the precision and speed of it is lower.The measuring error is produced in mea surement because the old method can not recognize the multi-peak in scatting sp ectrum.In the paper,a new method is put out in which different scatting response value V is transformed into different address by A/ D and the number of particles is put in this unit.After all,the measuring precisi on and the speed of it and meanwhile the number of the channel are raised greatl y.
出处
《光电子.激光》
EI
CAS
CSCD
2000年第3期306-308,共3页
Journal of Optoelectronics·Laser