摘要
本文提出了一种对荫罩式彩显管分辨率进行自动化测试的方法。这个方法以传统双狭缝法为基础 ,用计算机控制的微偏转系统将亮线扫过待测区域 ,用面阵 CCD获取图像。通过分析采集的数据 。
This paper proposes an approach of automating resolution measurements on shadow mask CRT displays.This new technique is based on conventional double slit method.A computer controlled deflection system of micro displacement is used to perform the scan of beam line across the test region.Then the image was captured by a CCD area sensor.By analyze the data acquired,we can get the beam line width.
出处
《真空电子技术》
2000年第3期44-47,共4页
Vacuum Electronics
关键词
分辨率测试
彩显管
荫罩式
CRT
Resolution measurement
Micro deflection system