摘要
以激光碳等离子体作为软X射线源,同时用平场光栅谱仪、常栅距光栅谱仪测量了类氢和类氦离子谱线强度,以一级谱线强度为标准,给出了平场光栅谱仪高级次光谱的相对衍射效率。
The spectral intensities are measured using a flat-field grating spectrograph and a equallyspaced grooves grating spectrograph with a laser-produced C-plasma as a soft X-ray source. The efficiencieson different diffraction orders are given relative to the first order.
出处
《强激光与粒子束》
EI
CAS
CSCD
北大核心
1999年第6期701-704,共4页
High Power Laser and Particle Beams
基金
中国工程物理研究院科学基金
关键词
平场光栅谱仪
光谱测量
衍射效率
flat-field grating spectrograph
spectra measurement
diffraction efficiency