摘要
慢正电子束技术是近十几年来发展起来的探测材料近表面微结构的新手段 .文章介绍了其在薄膜。
The use of a variable energy positron beam is a new technique for probing the near surface structure of solids. The basic method and some results for certain films, interfaces and near surfaces are described.
出处
《物理》
CAS
2000年第5期308-312,共5页
Physics
关键词
慢正电子束
界面
薄膜
近表面微观结构
variable energy positron beam, S parameter, defects interface
