摘要
以富士和秦冠苹果为材料,经过1-MCP或乙烯利处理,在0.1～3980kHz范围内,用日置智能LCR仪测定果实贮藏期间10个电学参数的变化,并测量了苹果的硬度、可滴定酸和果皮色度等品质指标,分析了二者的关系。结果表明:随着频率的增加和贮藏时间的延长,复阻抗(Z)值均逐渐减小。富士苹果的Z值与可滴定酸相关性达到极显著水平。可用电学参数串联等效电阻(R_S)和Z值建立回归方程反映品质指标硬度、可滴定酸的变化,可通过相对介电常数(ε′)和Z值来预测苹果色度的变化,从而进行果品无损检测。
Ten electrical parameters of Fuji and Qinguan apples treated with 1-methylcyclopropene （1-MCP） or ethephon during storage were measured using an intelligent LCR Hioki tester in the range of 0.1 to 3980 kHz, and quality indexes including firmness, titratable acid content, and peel chromaticity were also determined. Meanwhile the relationship between the tested electrical parameters and quality indexes was analyzed. Results showed that for both apple cultivars, Z value revealed a decreasing trend with increasing electric frequency and prolonged storage time. An extremely significant correlation between Z value and titratable acid content was observed. Regression models for firmness versus Rs, titratable acid content versus Z, and b＊ versus e＇ or Z were established which allowed non-destructive detection of apples.
出处
《食品科学》
EI
CAS
CSCD
北大核心
2013年第2期298-302,共5页
Food Science
基金
农业部现代苹果产业技术体系项目(08080703)
