ICP-AES测定金属硅中的硼

Determination of B impurity in Silicon Metal by ICP-AES

本文以氢氟酸和硝酸在聚四氟乙烯容量瓶中直接溶解样品，最大限度避免元素挥发损失。电感耦合等离子体发射光谱仪，测定金属硅中的杂质元素硼。运用了干扰元素校正程序IEC，替代基体匹配法，消除元素干扰，方便快捷，可操作性更强。实验结果表明，回收率为96％-104％，相对标准偏差（RSD）（n=11）：2．09％

Established a method that determined of B in 5ihcon Metal by ICP-AES.Samples were resolved by HF-HNO3 in plastic bottle,maximum of efficiency to avoid element loss,application IEC to eliminate interference element.Retrieve rate in the rang of 96%-104%,RSD（n=11）：2.09.The method operate easy,analysis fast,exact result.