两种旁路二极管结温测试方法的分析与比较

Analysis and comparison of two test methods of junction temperature of bypass diode

搭建了旁路二极管结温测试的两个测试平台,一个是稳态法测试平台,一个是瞬态法测试平台,并在两个平台上进行了多次试验。结果表明,旁路二极管结温测试具有较高的测试不确定性。相对而言,稳态法重复性和稳定性比较高。在保证热阻RTHjc值可靠的情况下,建议采用稳态法进行结温测试。

According to international standard, two platforms for bypass diode junction temper ature testing were constructed. One was steady state method, and the other was pulsed state method. Several times of tests were carried on in the platform. The results showed that junction temperature test had high uncertainty. Comparatively, the repeatability and stability of steady state method were relatively high. In case of the reliability of the thermal resistance, RTHjc, steady state method was suggested for junction temperature test.