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La掺杂ZnS的电子结构与稳定性的研究 被引量:3

Study on Electronic Structure and Stability of La-doped ZnS
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摘要 采用第一性原理赝势平面波方法研究了La掺杂ZnS体系的电子结构与稳定性。通过对掺杂前后各模型的形成热、结合能、能带结构、态密度、Mulliken电荷和键重叠聚居数的计算与分析,结果表明:La置换ZnS中的Zn是许可的,且能够稳定存在;La原子较Zn原子具有较强的失电子能力,La原子的掺入,对ZnS体系具有共价键与离子键的共同作用;导致体系能带结构发生明显变化,禁带宽度变小,系统发生Mott转变,从半导体变为金属;原子半径较大的La原子致使其周围的电子分布表现出一定的各向异性。 Electronic structure and stability of La-doped ZnS were studied by the first princi- ple plane-wave pseudopotential method. The systematic investigation on formation heat, cohesive energies, energy band structure, state density, mulliken charge and bond overlap population of ZnS with and without La-doping had been performed. Calculation results showed that displace- ment reaction of Zn by La in La-doped ZnS was allowed and exist stably. La atoms owned larger ability of lossing electrons than that of Zn atoms. Thus, covalent bonds and ionic bonds both ex- ist in La-doped ZnS systems. La-doping narrowed the band gap of ZnS systems. La doped ZnS system changed from semiconductor into metal through the Mott transition. Due to larger atom radius of La than that of Zn, anisotropy of electron distribution around La atom was depicted.
出处 《固体电子学研究与进展》 CAS CSCD 北大核心 2013年第1期1-5,共5页 Research & Progress of SSE
基金 湖南省重点学科建设项目 湖南省自然科学基金资助项目(11JJ2034)
关键词 电子结构 稳定性 硫化锌 第一性原理计算 electronic structure stability zinc sulfide first principle calculation
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  • 1贾宝平,贺跃辉,唐建成,邓意达,黄伯云,刘业翔.ZnS掺杂技术研究及应用现状[J].材料导报,2002,16(8):20-23. 被引量:10
  • 2Borse P H, Deshmukh N, Shinde R F, et al. Luminescence quenching in ZnS nanoparticles due to Fe and Ni doping[J]. Journal of Materials Science, 1999, 34 (24) : 6087-6093.
  • 3Sambasivam S,Joseph D P,Raja Reddy D,et al. Synthesis and characterization of thiophenol passivated Fe-doped ZnS nanoparticles[J]. Materials Science and Engineering B, 2008, 150(2): 125-129.
  • 4Sarkar R, Tiwary C S, Kumbhakar P, et al. Enhanced visible light emission from Coz- doped ZnS nanoparticles [J]. Physica B: Condensed Matter, 2009, 404(21): 3855-3858.
  • 5Bhargava R N, Gallagher D, Hong X, et al. Optical properties of manganese-doped nanocrystals of ZnS [J].Phys Rev Lett, 1994, 3(72): 416-419.
  • 6Datta A,Panda S K,Chaudhuri S. Phase transformation and optical properties of Cu-doped ZnS nanorods [J].J Solid State Chem, 2008, 181(9): 2332-2337.
  • 7Xie Haiqing, Peng Li, Peng Ping, et al. First-principles study on optical and electronic properties of Ladoped ZnS[J]. International Journal of the Physical Sciences, 2010, 5(17):2672-2678.
  • 8谢海情,陈圆,黄维清,黄桂芳,彭平,彭黎,王太宏,曾云.Optical Characteristics of La-Doped ZnS Thin Films Prepared by Chemical Bath Deposition[J].Chinese Physics Letters,2011,28(2):212-215. 被引量:2
  • 9Perdew J P, Burke K. Ernzerhof M. Generalized gradient approximation made simple[J]. Phys Rev Lett, 1996, 77(18): 3865-3868.
  • 10Vanderbilt D. Soft self-consistent pseudopotentials in a generalized eigenvalue formalism[J]. Phys Rev B, 1990, 41(11): 7892-7895.

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  • 1VALOV I, KOZICKI M N. Cation-based resistance change memory [J]. Phys: D, 2013, 46 (7): 07d005.
  • 2ZHANG H W, LIU L F, GAO B, et al. Gd-doping effect on performance of HfO2 based resistive switching memory devices using implantation approach [ J]. Appl Phys Lett, 2011, 98 (4): 042105-042107.
  • 3GAO B, ZHANG H W, YU S, et al. Oxide-based RRAM: uniformity improvement using a new material- oriented methodology [ C ] //Proceedings of Symposium on VLSI Technology. Honolulu, Hi, USA, 2009: 30-31.
  • 4LIU Q, SUN J, LV H B, et al. Real-time observation on dynamic growth/dissolution of conductive filaments in oxide-electrolyte-based ReRAM [J]. Advanced Materi- als, 2012, 24 (14): 1844-1849.
  • 5LIU Q, LONG S B, WANG W, et al. improvement of resistive switching properties in ZrO2-based ReRAM with implanted Ti ions [ J ]. IEEE Electron Device Lett, 2009, 30 (12): 1335-1337.
  • 6LIU M, LIU Q, LONG S B, et al. Formation and Annihilation of Cu Conductive Filament in the Nonpolar Resistive Switching Cu/ZrO : Cu/Pt ReRAM [ J ]. ISCAS, 2010 (1): 1-4.
  • 7LIU Q, LONG S B, LV H B, et al. Controllable growth of nanoscale conductive filaments in solid- electrolyte-based ReRAM by using a metal nanocrystal covered bottom electrode [ J ]. ACS Nano, 2010, 4 (10): 6162-6168. ber 2013.
  • 8LIU Q, LONG S B, WANG W, et al. Low power and highly uniform switching in ZrO2-based ReRAM with a Cu nanocrystal insertion layer [ J ]. IEEE Electron Device Lett, 2010, 31 (11): 1299-1301.
  • 9FANG Z, YU H Y, LI X, et al. HfOx/TiOx/HfOx/ TiOx multilayer-based forming-free RRAM devices with excellent uniformity [ J ]. IEEE Electron Device Lett, 2011, 32 (4): 566-568.
  • 10GAO B, SUN B, ZHANG H W, et al. Unified physical model of bipolar oxide based resistive switching memory [ J ]. IEEE Electron Device Lett, 2009, 30 (12): 1326 -1328.

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