光强极值法检测斯密特棱镜的偏振像差

Light intensity extremum measuring the schmidt prism polarization aberration

线偏振光经过斯密特屋脊棱镜后形成2个不同路径的椭圆偏振光,两路径椭圆偏振光经过检偏器后,旋转检偏器在一些特殊的角度时会得到光强极大值和光强极小值,用光线追迹法获得出射光的琼斯矩阵,分析此琼斯矩阵时意外发现,两路径的椭圆偏振光的位相差是不相同的,因此可以用位相差来表征斯密特棱镜偏振像差特性。采用光强极值法来检测斯密特棱镜的偏振像差,就是通过光强极值计算相应的位相差,即获得了偏振像差。

when a beam of linearly polarized light passed the Schmidt prism,which leads to two different elliptieally polar- ized light. The long axis angles of the two elliptically polarized light does not change with the change of the vibration plane of the incident linearly polarized light,which could used to depict the characteristics of the Schmidt prism. We use a ray tracing method for Jones matrix of the emitted light. When we analysis of the Jones matrix unexpected found that the bit difference of the elliptically polarized light of the two paths are not the same. So we can use the phase difference of the Schmidt prism to characterization of the polarization aberration characteristics. Using the extreme of light intensity meth- od to measuring the polarization aberration of the Schmidt prism that is calculated by the light intensity extremum corre- sponding bit in the difference,which is the polariz.ation aberration.