摘要
根据微处理器运算单元功能较多的特点,基于覆盖率的验证方法,设计一种自检查的测试程序生成器(SATG)验证方法。SATG采用一种"闭环"结构,并以功能覆盖率量化分析为核心,使用随机生成和约束求解的方法,自动生成验证程序。实验结果表明,该方法在微处理器运算单元的验证中,能提高验证效率和覆盖率,增强验证平台的可重用性。
According to the verification method based on coverage and the feature of arithmetic unit of microprocessor, this paper designs a Self-checking Automatic Test program Generator(SATG). SATG adopts a kind of "closed cycle" structure, takes the quantitative analysis of the functional coverage as the kernel module, and uses the randomly generating method and the constraint solving method, generating verification programs automatically. Experimental results show that the method can improve the efficiency and coverage of verification and enhance the reusability of verification platform.
出处
《计算机工程》
CAS
CSCD
2012年第13期221-223,共3页
Computer Engineering
基金
上海市自然科学基金资助项目"嵌入式CPU"(B17AI060-07139)