摘要
透射电子显微镜(Transimission Electron Microscope,TEM)薄膜样品的制备质量在TEM观察中非常重要。总结了钢铁材料TEM样品制备过程中的一些经验,对于采用双喷电解抛光方法制备的效果不理想的钢铁TEM样品,采用电解双喷减薄和离子减薄联合可以成功制备地TEM薄膜样品。
The quality of the TEM（transimission electron microscop） sample of thin films has great effect on TEM observation.Several experiences about TEM sample preparation for thin films of steel were summarized.Some TEM sample is unsuccessful use of twin-jet electropolishing method and it can be obtained satisfactory by uniting twin-jet electropolishing and ion milling method.
出处
《物理测试》
CAS
2013年第1期21-24,共4页
Physics Examination and Testing
基金
973项目"高性能钢的组织调控理论与技术基础研究"(2010CB630803)资助
