摘要
采用高频率电容式测厚仪测量并分析了降液膜膜厚和波动的统计规律,得到了降液膜沿竖直大平板流动平均膜厚经验关系式,发现了液膜流动的横向扩展和纵向发展规律。结果表明,降膜在竖直发展2.6m后可能已基本充分发展。
The statistical characteristics and the wave of a water film freely falling down a large vertical flat plate were investigated by capacitance probe, and the correlation of the mean film thickness based on Reynolds number was obtained. The way how the film extends horizontally was obtained, and the longitudinal characteristics show that the flow may be fully developed at 2.6 m from the origin.
出处
《原子能科学技术》
EI
CAS
CSCD
北大核心
2013年第2期213-217,共5页
Atomic Energy Science and Technology
基金
国家科技重大专项基金资助项目(2010ZX06002-005)
关键词
降液膜
膜厚
波动
流动发展
falling liquid film
film thickness
wave
flow development
