摘要
本文主要讲叙了电子元器件的失效机理和失效模式,据此介绍了当前相应的老炼方法,并阐述了老炼方法的实现。
This article mostly introduces the failure models of electric components. Meanwhile, several burn-in screening methods are illustrated. It also explains the reality of burn-in methods.
出处
《船电技术》
2013年第3期47-48,共2页
Marine Electric & Electronic Engineering
关键词
电子元器件
失效
老炼筛选
electric components
failure
burn-in screening
