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New de-embedding structures for extracting the electrical parameters of a through-silicon-via pair

New de-embedding structures for extracting the electrical parameters of a through-silicon-via pair
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摘要 Two innovative de-embedding methods are proposed for extracting an electrical model for a through- silicon-via (TSV) pair consisting of a ground-signal (GS) structure. In addition, based on microwave network theory, a new solution scheme is developed for dealing with multiple solutions of the transfer matrix during the process of de-embedding. A unique solution is determined based on the amplitude and the phase characteristic of S parameters. In the first de-embedding method, a typical "π" type model of the TSV pair is developed, which illustrates the need to allow for frequency dependence in the equivalent TSV pair Spice model. This de-embedding method is shown to be effective for extracting the electrical properties of the TSVs. The feasibility of a second de-embedding method is also investigated. Two innovative de-embedding methods are proposed for extracting an electrical model for a through- silicon-via (TSV) pair consisting of a ground-signal (GS) structure. In addition, based on microwave network theory, a new solution scheme is developed for dealing with multiple solutions of the transfer matrix during the process of de-embedding. A unique solution is determined based on the amplitude and the phase characteristic of S parameters. In the first de-embedding method, a typical "π" type model of the TSV pair is developed, which illustrates the need to allow for frequency dependence in the equivalent TSV pair Spice model. This de-embedding method is shown to be effective for extracting the electrical properties of the TSVs. The feasibility of a second de-embedding method is also investigated.
出处 《Journal of Semiconductors》 EI CAS CSCD 2013年第4期80-86,共7页 半导体学报(英文版)
基金 Project supported by the Opening Project of Key Laboratory of Microelectronics Devices & Integrated Technology,Institute of Microelectronics, Chinese Academy of Sciences support by 100 Talents Program(No.Y0YB049001) of Chinese Academy of Sciences
关键词 through-silicon vias de-embedding structure microwave network multiple solutions transmissionmatrix equivalent circuit through-silicon vias de-embedding structure microwave network multiple solutions transmissionmatrix equivalent circuit
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参考文献13

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