摘要
针对某型导弹用测温电路低温测试温度跳变故障,从原理上分析了故障产生的原因,采用试验及理论分析相结合的方法,找到了解决该故障的措施,对光电耦合器低温测试方法进行了改进,消除了故障隐患,提高了产品质量。
By analyzing the working principle of the missile temperature measurement Circuit,analyze the failure reason of it in cold climate condition:By experimentation and principle analyzing,the measure to avoid failure is found.The hidden trouble to failure is removed,through improving the testing method of photoelec- tric coupler.The quality of product is improved.
出处
《电子质量》
2013年第4期92-95,共4页
Electronics Quality
关键词
测温电路
低温
光电耦合器
temperature measurement Circuit
Cold Climate Condition
photoelectric coupler