摘要
在金刚石压砧装置上 ,采用电阻和电容测量方法研究了Hg1-xCdxTe(x =0 .19,0 .2 2 )在室温下、2 0GPa内的电阻、电容与压力的关系。实验结果表明 :它们分别在 0 .7~ 1.8GPa与 8.6GPa左右以及在 1.6GPa左右与 8.3GPa左右发生了两次电子结构相变 ;分别在 2GPa左右与 8.6GPa以上以及在 1.6GPa左右与 8.3GPa以上发生了两次晶体结构相变。同时 ,还在活塞 圆筒式p V关系测量装置上研究了Hg1-xCdxTe(x =0 .2 1)在室温下、4.5GPa内的p V关系。实验结果发现它在 2 .1GPa左右发生了相变。给出了它在相变前后的状态方程。
The resistance pressure and capacitance pressure relationships for Hg 1- x Cd x Te( x =0.19, 0.22 ) at room temperature at pressures up to 20GPa have been studied in a diamond anvil cell using resistance and capacitance measurements established by us.The experimental results show that Hg 1- x Cd x Te( x =0.19,0.22) undergo two electronic structure transitions at about 0.7~1.8GPa,8.6GPa and 1.6 GPa,8.3GPa,respectively,and two crystal structure transitions at about 2GPa,above 8.6GPa and about 1.6GPa,above 8.3GPa,respectively.In the present work,the p V relationship for Hg 1- x Cd x Te( x = 0.21 ) at room temperature and up to 4.5GPa has been studied using the piston cylinder type measurement device for the p V relationship.The experimental results indicate that the phase transition in Hg 1- x Cd x Te( x =0.21) occurs at about 2.1GPa.Its equations of state before and after the phase transition have been given.
出处
《高压物理学报》
CAS
CSCD
北大核心
2000年第1期28-32,共5页
Chinese Journal of High Pressure Physics
基金
中国科学院红外物理国家重点实验室基金资助
关键词
电阻
电容
状态方程
相变
半导体
高压
resistance,capacitance,equation of state,phase transition