矿物中单个有机包裹体测试与TOF-SIMS技术的应用

ANALYTICAL TECHNIQUES FOR INDIVIDUAL ORGANIC INCLUSIONS AND THE APPLICATION OF TOF-SIMS

有机包裹体是一种富含有机质的矿物流体包裹体。单个有机包裹体在研究成岩成矿作用和油气成藏历史过程方面具有重要的实用价值。目前常用于单个有机包裹体分析的技术有荧光光谱、显微傅立叶红外光谱、激光拉曼光谱和二次离子质谱 (SIMS)等。本文对这些方法的应用现状和存在的问题进行了客观的分析 ,同时还介绍了一种可用于单个有机包裹体分析的新技术飞行时间二次离子质谱 (TOF SIMS) ,对其分析原理。

Organic inclusions are a kind of mineral fluid inclusions, which mainly contain organic matter. Individual organic inclusions have a valuable application in investigating the process and history of ore and oil/gas formation and accumulation. Many techniques including fluorescence spectrometry, Micro\|FT.IR, LRM and SIMS now have been widely used to analyze individual organic inclusions, but problems still remain with samples and techniques themselves. A new microanalysis technique, Time\|Flight\|Secondary Ion Mass Spectrometry (TOF\|SIMS) is recommended in the paper, which is one of the most prospective techniques for analyzing individual organic inclusions contained in minerals.