瞬态传导骚扰测试方法及其抑制技术的探讨

Research on the Transient Conducted Emission Test Method and its Suppression Techniques

介绍了瞬态传导骚扰的形成机理、危害及几种常用的测试方法,并综合其他研究人员的成果和自身经验对瞬态传导骚扰提出了相应的抑制措施,希望能对从事相关技术研究的电子产品设计者和电磁兼容工程师有所帮助。

Formation mechanism, electromagnetic interference damage and common test methods of transient conducted emission are introduced. Base on other researchers ＇and authors ＇working experience, some suppression measures of transient conducted emission are proposed to help electronic designers and EMC engineers research on the related techniques.