PVDF压电系数d_(31)受温度影响的试验测定

Measurement of Piezoelectric Coefficient d_(31) of PVDF Thin Films at Different Temprature

为获得PVDF薄膜压电系数d31在不同温度时的值,采用了准静态拉伸的直接测量技术。简要介绍了准静态拉伸的测量方法及其试验装置,给出了试验结果。通过试验,精确地测定了PVDF在温度范围为-20～+70℃内压电系数d31的值,同时试验也表明,准静态拉伸测量薄膜压电特性的试验方法简单可靠,测量结果合理。

In order to obtain piezoelectric coefficient of d31 PVDF film, a new quasistatic stretching direct meas- urement method was uesd. The tester and measurement results were presented in this paper. The values of piezoe- lectric coefficient d31 of PVDF film were more exactly measured at the temperature from --20- ＋ 70 ℃ during the test. The experiment also showed that the quasistatic stretching method for measuring piezoelectric coefficient of film is reliable and simple and the measuring results were reasonable and accurate.