基于MM*模型下悲观诊断系统的高效故障诊断

Efficient Fault Identification of Pessimistic Diagnosable Systems under MM* Model

在系统故障诊断中,悲观诊断与精确诊断相比,前者可以显著提高系统的自诊断能力。而当前对于t1/t1-可诊断系统却没有很好的基于MM*模型的悲观诊断算法。因此,本文在MM*模型下,研究了t1/t1-可诊断系统的诊断算法,并提出了一个时间复杂度为O(N^(2.5))的悲观诊断算法,Ⅳ代表处理器节点总数。在时间复杂度方面,这是一个比较高效的诊断算法。

In comparison with precise diagnosis, pessimistic diagnosis can enhance the self-diagnosing capability of a system. So far, there isn＇t efficient pessimistic diagnosis algorithm for t1/t1 -diagnosable system under MM ＊ model. So,in this paper,the fault diagnosis oft1/t1 -diagnosable system is addressed under the MM ＊ model, proposing an O （N2. 5 ） algorithm for pessimistic diagnosis of t1/t1-diagnosable system, where N denote the total number of the processors. In terms of time complexity, the presented algorithm is efficient.