大豆结荚习性的本质是茎上下端粗细的差异

Difference of Diameter at Top and Base of Main Stem Was Essentially Distinguishing Factor of Different Pod-bearing Habit in Soybean

利用同一杂交组合F5代的4对主茎上下端粗细差异不同的等位基因系进行了6年的产量试验。结果表明,在正常和较干旱年份,主茎上下端粗细差异较大的偏无限的亚有限型等位基因系的平均产量较高,而在多雨年份则相反。供试6年的平均产量,差异大的类型比差异小的类型高3.5%,t测验表明两组平均数差异达到极显著水准,产量的变动指数小5个百分点。茎两端粗细差异较大的等位基因系对试验环境有较好的适应能力。因此,大豆植株上下端粗细的相对差异是不同结荚习性大豆更为本质的区别因素。

4 pairs of a11elic lines that had different difference of diameter at top and base of main stem were used for yield test of six years. The results showed that average yield of indeterminate-semideterminate lines was more than that of semideterminate-indeterminate lines in normal or dry years, on the contrary in more rainfall years. Average yield of more difference type was 3.5 percent higher than that of less difference type in six years, that difference of two group was extreme significant by t-test. Yield fluctuation index was less than 5 percent. Allelic lines of more difference type had better suitable ability for experiment environment. So, difference of diameter at top and base of main stem should be essentially differentiation characteristic.