摘要
本文报道了半导体气敏元件的内电势是引起测试中反常现象的原因。然后分析了内电势对元件测量的影响,并提出了消除内电势造成的测量误差的有效方法。
The inner e. m. f. of a semiconductor gas' sensor is reported, which is the reason of measurement abnormity.Its effect on measurement is analyzed, and an effective method is proposed to eliminate the measurement error due to the c.m f..
出处
《传感器技术》
CSCD
1991年第6期34-37,共4页
Journal of Transducer Technology