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In-situ high-pressure behaviors of double-perovskite Sr_2ZnTeO_6

In-situ high-pressure behaviors of double-perovskite Sr_2ZnTeO_6
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摘要 Structural and spectroscopic properties of Sr2ZnTeO6 (SZTO) were investigated by angle-dispersive synchrotron X- ray powder diffraction and Raman spectroscopy in a diamond anvil cell up to 31 GPa at room temperature. Although SZTO remained stable up to the highest pressure, the different pressure coefficients of the normalized axial compressibility were obtained as βab=8.16×10-3 GPa-1 andβc=7.61 x 10-3 GPa-1. The bulk modulus B0 was determined to be 190(1) GPa by fitting the pressure-volume data using the Birch-Mumaghan equation of state. All the observed Raman modes exhibited a broadening effect under high pressure. The vibrational band V1 around 765 cm-1, which is associated with the Te-O stretching mode in the basal plane of the TeO6 octahedron had the largest pressure coefficient, and the Griineisen parameters for all the observed phonon modes were also calculated and presented. These parameters could be used to measure the amount of uniaxial or biaxial strain, providing a fundamental tool for monitoring the magnitude of the shift of phonon frequencies with strains. Structural and spectroscopic properties of Sr2ZnTeO6 (SZTO) were investigated by angle-dispersive synchrotron X- ray powder diffraction and Raman spectroscopy in a diamond anvil cell up to 31 GPa at room temperature. Although SZTO remained stable up to the highest pressure, the different pressure coefficients of the normalized axial compressibility were obtained as βab=8.16×10-3 GPa-1 andβc=7.61 x 10-3 GPa-1. The bulk modulus B0 was determined to be 190(1) GPa by fitting the pressure-volume data using the Birch-Mumaghan equation of state. All the observed Raman modes exhibited a broadening effect under high pressure. The vibrational band V1 around 765 cm-1, which is associated with the Te-O stretching mode in the basal plane of the TeO6 octahedron had the largest pressure coefficient, and the Griineisen parameters for all the observed phonon modes were also calculated and presented. These parameters could be used to measure the amount of uniaxial or biaxial strain, providing a fundamental tool for monitoring the magnitude of the shift of phonon frequencies with strains.
出处 《Chinese Physics B》 SCIE EI CAS CSCD 2013年第5期644-649,共6页 中国物理B(英文版)
基金 Project supported by the National Natural Science Foundation of China (Grant No. 51172091) the Program for New Century Excellent Talents in University,China the National Fund for Fostering Talents of Basic Science, China (Grant No. J1103202)
关键词 crystal structure high pressure X-ray diffraction optical spectroscopy crystal structure, high pressure, X-ray diffraction, optical spectroscopy
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