电子散斑干涉测量中相移技术的新发展

New development of phase-shift techniques in electronic speckle pattern interferometry

电子散斑干涉测量技术是一种全场、非接触、高精度和高灵敏度的光学测量方法,广泛应用于航空航天和精密机械制造等领域。相移技术是电子散斑干涉测量中重要的技术,适用于电子散斑干涉测量的相移技术近年来得到了快速发展,出现了许多新的相移技术,包括时间相移技术和空间相移技术。其中4+2和4+1等快速相移技术的出现使得时间相移技术的应用从静态与准静态测量领域扩展到动态测量领域;而空间傅里叶变换技术则使空间相移技术朝着多维和同步动态测量等方向改进。对电子散斑干涉测量技术中的时间相移技术和空间相移技术的优缺点进行了比较,并介绍它们的发展近况。

Electronic speckle pattern interferometry （ESPI） is a whole-field, non-contact, and high accuracy optical measuring method. It has been widely used in the aerospace and precision machinery manufacturing industry due to its extremely high measuring sensitivity. In the aim of further improvement in higher deformation measuring accuracy, phase-shift technique is introduced into ESPI to improve the measuring accuracy of phase. In recent years, the phase-shift technique applied in ESPI meets a rapid development. Many phase-shift methods are proposed, which can be mainly divided into two kinds, temporal phase-shift technique and spatial phase-shift technique. The temporal phase-shift technique which is traditionally fit for static and quasi-static measurement now is improved so that it can be used in dynamic measurement, while the spatial phase-shift technique is undergoing an evolution of multi- dimensional and simultaneous dynamic testing. This paper gives a review of temporal and spatial phase shift techniques, introduces their recent development, and compares their advantages and disadvantages for practical applications.