摘要
通过电子束和接触式曝光相结合的混合曝光方法,并利用复合胶结构,一次电子束曝光制作出具有T型栅的HFET(HeterojunctionField-EffectTransistor)器件,并对0.1μm栅长HFET器件的整套工艺及器件性能进行了研究。形成了一整套具有新特点的HFET器件制作工艺,获得了良好的器件性能(ft=78GHz;gm=440ms/mm)。
HFET device with T- shape gate have been developed by the Mixed Lithography- a new lithography method jointed EBL and normal contact lithography. The multilayer resist technique and different developing are used to obtain a T- shape gate structure. The whole set of processes and device characteristic of 0.1μ m gate- length HFET have been studied. 440ms/mm gm and 78GHz, ft of HFET have been achieved.
出处
《功能材料与器件学报》
CAS
CSCD
2000年第3期193-196,共4页
Journal of Functional Materials and Devices
关键词
混合曝光
HFET
T型栅
工艺研究
深亚微米栅
Two Dimension Electron Gas (2DEG)
Electron Beam Lithography (EBL)
Mixed Lithography
HFET
T- shape gate