摘要
作为32位RISC微处理器主流芯片,ARM芯片得到长足发展和广泛应用。因而,ARM芯片的测试需求更加强劲的同时,测试工作量在加大,测试复杂度也在增加。本文给出了基于ARM Cortex—M3的微处理器测试方法,该方法也可用于类似结构的微处理器测试。
ARM, one of the most popular 32-bit ILISC microprocessors, has been developed rapidly and got widely application. Therefore, the requirement for testing ARM is booming, the workload and complexity for testing ARM based processors is increasing as well. This paper presents a test solution for ARM Cortex-M3 based processors, which can also be applied to test microprocessors with the similar structure.
出处
《电子测试》
2013年第4期48-51,共4页
Electronic Test